Test and Repair of Reconfigurable On-chip Instrument Access Networks
As transistors in integrated circuits (ICs) are becoming smaller, faster and more, it has become harder to avoid malfunctioning. Embedded instruments are increasingly used to test, tune, and configure the transistors in ICs. IEEE Std.1149.1-2013 and IEEE Std.1687 standardize the access to these embedded instruments. IEEE Std.1687 enables reconfigurable scan networks which allow only desirable inst