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Combined Test Data Compression and Abort-on-Fail Test

The increasing test data volume needed for the testing of System-on-Chips (SOCs) leads to high Automatic Test Equipment (ATE) memory requirement and long test application times. Scheduling techniques where testing can be terminated as soon as a fault appears (abort-on-fail) as well as efficient compression schemes to reduce the ATE memory requirement have been proposed separately. Previous test da

The organic/inorganic interface: a study of direct electron transfer

Porphyrins have become an interesting class of molecules in studies of molecular electronics. They are, however, sensitive to handling procedures and may give different results in electronic or optical properties depending on the method used for coupling or adsorption. We present electronic measurements of a heme porphyrin mounted in a biomolecular structure-an enzyme-and show that a direct electr