Combined Test Data Selection and Scheduling for Test Quality Optimization under ATE Memory Depth Constraint
Testing is used to ensure high quality chip production. High test quality implies the application of high quality test data; however, the technology development has lead to a need of an increasing test data volume to ensure high test quality. The problem is that the test data volume has to fit the limited memory of the ATE (Automatic Test Equipment). In this paper, we propose a test data truncatio